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Photonics | Free Full-Text | Study of Single Event Burnout Mechanism in GaN Power Devices Using Femtosecond Pulsed Laser
Photonics | Free Full-Text | Study of Single Event Burnout Mechanism in GaN Power Devices Using Femtosecond Pulsed Laser
Workstation for Laser Testing of Single Events Effects
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Workstation for Laser Testing of Single Events Effects
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Workstation for Laser Testing of Single Events Effects
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Unravelling the secrets of the resistance of GaN to strongly ionising radiation | Communications Physics
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PDF) Testing and Calibration of an Ultraviolet-A Radiation Sensor Based on GaN Photodiode
Ionizing radiation hardness tests of GaN HEMTs for harsh environments - ScienceDirect
Photonics | Free Full-Text | Study of Single Event Burnout Mechanism in GaN Power Devices Using Femtosecond Pulsed Laser
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