A, XPS atomic concentration of different species as a function of... | Download Scientific Diagram
Optical diagnostics of the magnetron sputtering process of copper in an argon–oxygen atmosphere | Journal of Materials Science: Materials in Electronics
XPS depth profiles of the RO (a), EP (b), and PO (c) samples. EP =... | Download Scientific Diagram
Time evolution of the atomic concentration of W with respect to Be... | Download Scientific Diagram
XPS/AES Examples of Activity | Wolfson Applied Materials Research Centre | Tel Aviv University
a) Schematic of AES depth profile measurement. The atomic... | Download Scientific Diagram
Effective Reduction of Chromium-oxy-hydroxide Evaporation from Ni-Base Alloy 690 | High Temperature Corrosion of Materials
Sputter etch time-dependent Mo and S atomic concentration of MoS2 layer | Download Scientific Diagram
Depth profiling by XPS analysis for the sputtering time vs atomic... | Download Scientific Diagram
Preparation of Cu(In,Ga)Se2 thin film by sputtering from Cu(In,Ga)Se2 quaternary target - ScienceDirect
Synthesis and Characterization of Liquid MOCVD Precursors for Thin Films of Cadmium Oxide | Chemistry of Materials
XPS profiles of elements atomic concentration versus the time of... | Download Scientific Diagram
a A plot of atomic concentration percentage as a function of sputtering... | Download Scientific Diagram
Coatings | Free Full-Text | ESCA as a Tool for Exploration of Metals' Surface
Sputtering Deposition | IntechOpen
a) Atomic concentration of deposited SiNx film at sputtering time 2... | Download Scientific Diagram
Atomic concentration of oxygen, titanium, tantalum palladium and carbon... | Download Scientific Diagram
Materials | Free Full-Text | Investigation of the RF Sputtering Process and the Properties of Deposited Silicon Oxynitride Layers under Varying Reactive Gas Conditions
Sputtering Deposition: A Complete Guide To Method - VacCoat
Sputter Yield - an overview | ScienceDirect Topics
Atomic layer deposition of SnSe x thin films using Sn(N(CH 3 ) 2 ) 4 and Se(Si(CH 3 ) 3 ) 2 with NH 3 co-injection - Dalton Transactions (RSC Publishing) DOI:10.1039/D1DT03487A
XPS profiles of elements atomic concentration versus the time of... | Download Scientific Diagram